Dear Subscribers,

In January, we sent several units of the C0-microSD and SD-Dev platforms off to TÜV in Nuremberg, to test and certify their conformance to international standards (EN IEC 55032 + 55035, FCC 47 CFR part BL 15.107 and 15.109, and RoHS).

Compliance with standards such as EN IEC 55032/55035 (Europe), RoHS (Europe), and FCC Part 15 (USA) is often mandatory for selling products in the corresponding regions; certification demonstrates adherence to these standards.

Preparing pre-production units for shipment to TUV also provided an opportunity for us to test the packaging solution we intend to use for final shipment of the platforms to campaign backers.

Test Results

Both C0-microSD and the SD-Dev platforms successfully passed the following tests of adherence to FCC, EU, and UK electromagnetic compatibility (EMC) standards:

• Radiated Electric Emissions (30 MHz – 1 GHz): Measures the electromagnetic energy radiated from the device in the lower frequency range. This test ensures that emissions remain below regulatory limits to prevent interference with other devices.
• Radiated Electric Emissions (1 GHz – 6 GHz): Similar to the previous test but focuses on the higher frequency band. It assesses the device’s performance in emitting unwanted RF energy, confirming compliance with stricter high-frequency standards.
• Electrostatic Discharge (ESD) Immunity Test: Simulates static discharges, both by direct contact and through the air, to verify that the device can withstand sudden voltage spikes without performance degradation or damage.
• Radiated Electric Immunity (80 MHz – 5.1 GHz): Evaluates the device’s ability to operate normally when exposed to external electromagnetic fields across a wide frequency spectrum. The test ensures robustness against interference from ambient RF sources.
• Power Frequency Magnetic Field Immunity Test: Exposes the device to magnetic fields typically generated by power lines (at 50/60 Hz) to check its resilience. This test confirms that the device remains functional in environments with significant magnetic field exposure.
• Conducted Voltage Emission (150 kHz – 30 MHz) on AC (via additional power supply): Assesses the voltage noise conducted along the power cables from the device, within the specified frequency range, when operating on an AC supply. This test was performed using an off-the-shelf power supply to simulate real-world AC conditions and ensure that conducted emissions remain within the limits set by FCC standards.

TUV conducted all of the tests for the C0-microSD using the SD-Dev as a host, after the latter passed all tests. Following are a couple of example photographs of the setup used by the TUV testing lab for testing radiated electrical emissions (left) and radiated electric immunity (right).

RoHS testing is still ongoing.

What’s Next

​Given the one-month delay in our production process due to the certifications, we now anticipate shipping to backers around mid-June. In the next updates, we will provide more details on packaging solutions we’ve converged on for delivery of the C0-microSD and SD-Dev platforms, as well as details on datasheets and quickstart guides that we have prepared and are polishing ahead of shipping units to campaign backers.